• NUCLEAR TECHNIQUES
  • Vol. 47, Issue 7, 070401 (2024)
Hao YANG1,2,3, Shuxiang LU1,*, Huaishen LI2, Shaojia CHEN2,3,**..., Bin TANG2,3, Xiuku WANG2,3, Lixin ZENG2,3, Li YU2,3, Zhiyong WAN2,3, Huiyin LIU1,2,3 and Zhijia SUN2,3|Show fewer author(s)
Author Affiliations
  • 1Zhengzhou University, Zhengzhou 450001, China
  • 2Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 3Spallation Neutron Source Science Center, Dongguan 523803, China
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    DOI: 10.11889/j.0253-3219.2024.hjs.47.070401 Cite this Article
    Hao YANG, Shuxiang LU, Huaishen LI, Shaojia CHEN, Bin TANG, Xiuku WANG, Lixin ZENG, Li YU, Zhiyong WAN, Huiyin LIU, Zhijia SUN. Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source[J]. NUCLEAR TECHNIQUES, 2024, 47(7): 070401 Copy Citation Text show less
    Schematic diagram of the second-generation neutron scintillator detector's structure for CSNS
    Fig. 1. Schematic diagram of the second-generation neutron scintillator detector's structure for CSNS
    Waveform of neutron signal
    Fig. 2. Waveform of neutron signal
    Waveform of γ signal
    Fig. 3. Waveform of γ signal
    Schematic diagram of the signal processing method
    Fig. 4. Schematic diagram of the signal processing method
    Schematic diagram of the test system
    Fig. 5. Schematic diagram of the test system
    Photograph of ASIC test board
    Fig. 6. Photograph of ASIC test board
    Digital readout board
    Fig. 7. Digital readout board
    Configuration sequence diagram of CSNS_VASD chip
    Fig. 8. Configuration sequence diagram of CSNS_VASD chip
    Flow chart of data processing
    Fig. 9. Flow chart of data processing
    Distribution diagram of the nonlinear error
    Fig. 10. Distribution diagram of the nonlinear error
    Distribution diagram of the gain
    Fig. 11. Distribution diagram of the gain
    Snapshot of detection efficiency test of the detector in neutron beamline of CSNS
    Fig. 12. Snapshot of detection efficiency test of the detector in neutron beamline of CSNS
    Detector's uniformity before optimization
    Fig. 13. Detector's uniformity before optimization
    Detector's uniformity after optimization
    Fig. 14. Detector's uniformity after optimization
    通道号Channel均方根RMS / mV等效噪声电压ENV / mV
    01.780.336
    11.740.329
    21.740.328
    31.740.328
    42.790.526
    51.690.318
    61.660.301 3
    72.810.529
    83.320.627
    92.250.425
    102.260.426
    112.290.431
    121.830.346
    131.750.331
    141.920.362
    151.810.341
    Table 1. Noise test
    Hao YANG, Shuxiang LU, Huaishen LI, Shaojia CHEN, Bin TANG, Xiuku WANG, Lixin ZENG, Li YU, Zhiyong WAN, Huiyin LIU, Zhijia SUN. Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source[J]. NUCLEAR TECHNIQUES, 2024, 47(7): 070401
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