• Chinese Optics Letters
  • Vol. 13, Issue 12, 121201 (2015)
Weiping Wang, Yidong Tan, Shulian Zhang*, and Yan Li
Author Affiliations
  • Department of Precision Instrument, State Key Lab of Precision Measurement Technology and Instrument, Tsinghua University, Beijing 100084, China
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    DOI: 10.3788/COL201513.121201 Cite this Article Set citation alerts
    Weiping Wang, Yidong Tan, Shulian Zhang, Yan Li. Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser[J]. Chinese Optics Letters, 2015, 13(12): 121201 Copy Citation Text show less
    Configuration and physical principles of the system. (a) The system schematic. (b) The normalized defocusing curve with a certain objective. (c) The calibrated linear range.
    Fig. 1. Configuration and physical principles of the system. (a) The system schematic. (b) The normalized defocusing curve with a certain objective. (c) The calibrated linear range.
    Nd: YVO4 laser output power before and after temperature control. (a) Laser output power before temperature control. (b) Laser output power after temperature control.
    Fig. 2. Nd:YVO4 laser output power before and after temperature control. (a) Laser output power before temperature control. (b) Laser output power after temperature control.
    Normalized linear ranges with different objective lenses. (a) Linear range with the objective of NA=0.65. (b) Linear range with the objective of NA=0.55. (c) Linear range with the objective of NA=0.3.
    Fig. 3. Normalized linear ranges with different objective lenses. (a) Linear range with the objective of NA=0.65. (b) Linear range with the objective of NA=0.55. (c) Linear range with the objective of NA=0.3.
    Measured results of the silicon grating profile. (a) Grating profile measured by AFM. (b) Grating profile measured by our system.
    Fig. 4. Measured results of the silicon grating profile. (a) Grating profile measured by AFM. (b) Grating profile measured by our system.
    Physical maps of the micro-gyroscope and the rotor. (a) The micro-gyroscope to be measured. (b) Upper: the rotor corroded from the micro-gyroscope; lower: the top view of the rotor.
    Fig. 5. Physical maps of the micro-gyroscope and the rotor. (a) The micro-gyroscope to be measured. (b) Upper: the rotor corroded from the micro-gyroscope; lower: the top view of the rotor.
    Cross section of the rotor along the scanning direction in Fig. 5(b). The red circle shows the edge to be measured.
    Fig. 6. Cross section of the rotor along the scanning direction in Fig. 5(b). The red circle shows the edge to be measured.
    Measurement results. Left: Lateral scanning diagram of the rotor; right: the edge slope of the rotor.
    Fig. 7. Measurement results. Left: Lateral scanning diagram of the rotor; right: the edge slope of the rotor.
    Different Position NumbersMeasured Values
    184.910°
    284.671°
    384.651°
    Table 1. Verticality of Micro-Gyro Rotor
    Weiping Wang, Yidong Tan, Shulian Zhang, Yan Li. Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser[J]. Chinese Optics Letters, 2015, 13(12): 121201
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