• Optoelectronics Letters
  • Vol. 18, Issue 8, 489 (2022)
Ting XUE* and Yan WU
Author Affiliations
  • School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
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    DOI: 10.1007/s11801-022-2022-9 Cite this Article
    XUE Ting, WU Yan. Measurement of thin liquid film thickness in pipes based on optical interferometry[J]. Optoelectronics Letters, 2022, 18(8): 489 Copy Citation Text show less
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    XUE Ting, WU Yan. Measurement of thin liquid film thickness in pipes based on optical interferometry[J]. Optoelectronics Letters, 2022, 18(8): 489
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