Study on ESPI Technique for Simultaneous Measurement of Whole in-Plane Displacement with the Polarization of Laser

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 26 >Issue 2 >Page 127 > Article

Chinese Journal of Lasers
Vol. 26, Issue 2, 127 (1999)

Study on ESPI Technique for Simultaneous Measurement of Whole in-Plane Displacement with the Polarization of Laser

[in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. Study on ESPI Technique for Simultaneous Measurement of Whole in-Plane Displacement with the Polarization of Laser[J]. Chinese Journal of Lasers, 1999, 26(2): 127 Copy Citation Text

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References

[1] Jun-ichi Kato, Ichirou Yamaguchi, Qi Ping. Automatic deformation analysis by a TV speckle interferometer using a laser diode. Appl. Opt., 1993, 32(1):77～83

[2] Eiolf Vikhagen. Nondestructive testing by use of TV holography and deformation phase gradient calculation. Appl. Opt., 1990, 29(1):137～144

[3] A. J. Moore, J. R. Tyrer. Two-dimension strain measurement with ESPI. Opt. Lasers Eng., 1995, 23(5):381～402

[4] F. M. Santoyo, M. C. Shellabear, J. R. Tyrer. Whole field in-plane vibration analysis using pulsed phase-stepped ESPI. Appl. Opt., 1991, 30(7):717～721

[5] J. A. Leendertz. Interferometric displacement measurement on scattering surfaces utilizing speckle effect. J. Phys. E, 1970,3(3):214～218

[6] A. J. Moore, J. R. Tyrer. An electronic speckle pattern interferometer for complete in-plane displacement measurement. Meas. Sci. Technol., 1990, 1(10):1024～1030

[7] K. Creath. Phase-shifting speckle interferometry. Appl. Opt., 1985, 24(18):3053～3058

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