• Optics and Precision Engineering
  • Vol. 23, Issue 12, 3322 (2015)
ZHANG Lei1,2,*, YANG Min-zhu1,2, ZOU Yao-pu1,2, and HAN Chang-pei2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20152312.3322 Cite this Article
    ZHANG Lei, YANG Min-zhu, ZOU Yao-pu, HAN Chang-pei. Instrument line shape of infrared Fourier transform spectrometer and its engineer applications[J]. Optics and Precision Engineering, 2015, 23(12): 3322 Copy Citation Text show less
    References

    [1] ZHANG CH M. Interference Imaging Spectroscopy[M]. Beijing: Science Press, 2010.(in Chinese)

    [2] ZHANG J,WANG SH R,HUANG Y,et al.. Status and development of limb imaging spectrometers[J].Chinese Optics,2013,6(5): 692-700.(in Chinese)

    [3] TREMBLAY J P. High Resolution Measurements of the Instrument Line Shape Function of Fourier-Transform Spectrometer[S]. Bad wildbad:11th International Workshop on Atmospheric Science from Space using Fourier Transform Spectrometry,2003.

    [4] Northrop Grumman Space & Mission Systems Corporation. Cross Track Infrared Sounder (CrlS) Sensor Data[R]. Redondo Beach, California, 2009.

    [5] SALONEN K I,SALOMAA I K, KAUPPINEN J K. Diffraction in a Fourier-transform spectrometer[J]. Applied Optics,1995,34(7):1190-1196.

    [6] PEKKASAARINEN J K A. Line-shape distortions in misaligned cube corner interferometers[J]. Applied Optics, 1992,31(1):69-74.

    [7] NIPLE E, PIRES A,POULTNEY S K. Exact modeling of lineshape and wave-number variations for off-axis detectors in Fourier Transform Spectrometer (FTS) sensor systems[J]. SPIE,1983,364:11-20.

    [8] GENEST J. Analytic solutions for nonuniformly illuminated off-axis detector[J]. Applied Optics, 1999,38(25):5438-5446.

    [9] BEST F A, BINGHAM G E,KNUTESON R O, et al.. Calibration of the Geostationary Imaging Fourier Transform Spectrometer (GIFTS)[J]. SPIE,2001,4151:1-11.

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    ZHANG Lei, YANG Min-zhu, ZOU Yao-pu, HAN Chang-pei. Instrument line shape of infrared Fourier transform spectrometer and its engineer applications[J]. Optics and Precision Engineering, 2015, 23(12): 3322
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