[1] Mitsuhashi T, Flanagan J W, Hiramatsu S. Optical diagnostic system for the KEK B-factory[A].Proceedings of EPAC 2000,Vienna[C]. Austria:2000,1783-1785.
[2] Flanagan J W,Hiramatsu S, Mitsuhashi T. Optical beamlines for the KEK B-factory synchrotron radiation monitors[A]. Proceedings of the 1999 Particle Accelerator Conference[C]. New York, 1999,2120-2122.
[4] Hofmann A, Meot F. Optical resolution of beam cross-section measurement by means of synchrotron radiation[J].Nucl.Instrum.Methods, 1982,203:483-493.
[5] Ieiri T. A real tme bunch-length monitor using the beam spectrum and measurements of bunch lengthening[J].Nucl.Instrum.Mthods,1993,329:371-380.
[6] Obina T, Kasuga T, Tobiyama M, et al.Measurement of the longitudinal bunch structure in the photon facotr positron storage ring with a photon counting method[J].Nucl. Instrum. Methods,1995,354(1):204-214.