[1] R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
[2] H. G. Tompkins and E. A. Irene, Handbook of ellipsometry (William Andrew Inc., New York, 2005).
[3] K. Vedam, Thin Solid Films 313-314, 1 (1998).
[4] H. Fukiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons, 2007).
[5] M. Erman and J. B. Theeten, J. Appl. Phys. 69, 859 (1986).
[6] L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Ar-win, Phys. Stat. Sol. (c) 2, 3293 (2005).
[7] W. Chegal, Y. J. Cho, H. J. Kim, H. M. Cho, Y. W. Lee, S. H. Kim, Jpn . J. Appl. Phys. 43, 6475 (2004).
[8] A. J. Choi, T. J. Kim, Y. D. Kim, J. H. Oh, and J. Jang, J. Korean Phys. Soc. 48, 1544 (2006).9. I. An, J. A. Zapien, C. Chen, A. S. Ferlauto, A. S. Lawrence and R. W. Collins, Thin solid films 455-456, 132 (2004).
[9] Y. Meng and G. Jin, Opt. Prec. Eng. 8, 316 (2000).
[10] P. S. Hauge and F. H. Dill, Opt. Commun. 14, 431 (1975).
[11] J. Lee, P. I. Rovira, Ilsin An, and R. W. Collins, Rev. Sci. Instrum. 69, 1800 (1998).
[12] D. E. Aspnes, J. Opt. Soc. Am. A 21, 403 (2004).
[13] R. Kleim, L. Kuntzler, and A. Elghemmaz, J. Opt. Soc. Am. A 11, 2550 (1994).
[14] Y. H. Meng, S. Chen, and G. Jin, Phys. Stat. Sol. (c) 5, 1046 (2008).
[15] Y. H. Meng, Y. Y. Chen, C. Qi, L. Liu, and G. Jin, Phys. Stat. Sol. (c) 5, 1050 (2008).