• Optics and Precision Engineering
  • Vol. 24, Issue 12, 3027 (2016)
XU Long-bo1,2,*, ZHOU You3, ZHU Ri-hong1, LIU Shi-jie3, and ZHENG Wan-guo4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: 10.3788/ope.20162412.3027 Cite this Article
    XU Long-bo, ZHOU You, ZHU Ri-hong, LIU Shi-jie, ZHENG Wan-guo. Measurement and calculation for reflective wavefront error of large optics at oblique incidence[J]. Optics and Precision Engineering, 2016, 24(12): 3027 Copy Citation Text show less
    References

    [1] WOLFE C R, LAWSON J K. The measurement and analysis of wavefront structure from large aperture ICF optics[R]. Office of Scientific & Technical Information Technical Reports, 1995, 2633:361-385.

    [2] ENGLISH R E, LAUMANN C W, MILLER J L, et al.. Optical system design of the National Ignition Facility[C]. International Optical Design Conference, 1998,726.

    [3] XU Q, GU Y Y, CHAI L, et al.. Measurement of wavefront power spectral density of large optical components[J].Acta Optica Sinica,2001,21(3):344-347. (in Chinese)

    [4] LIU SH J, JIN CH X,ZHOU Y, et al.. Investigation on measurement of mid-frequency wavefront error for large optics in high-power laser system[C]. Conference on Optical Measurement System forIndustrial Inspection IX,2015.

    [5] BAISDEN P A,ATHERTON L J,HAWLEY R A, et al.. Large optics for the national ignition facility [J]. Fusion Science and Technology,2016, 69: 295-351.

    [6] ZHU SH, ZHANG X H. Application of error detaching to Ritchey-Common test for flat mirrors [J]. Opt. Precision Eng.,2014, 22(1):7-12. (in Chinese)

    [7] ZHU SH, ZHANG X H. Comparative study on data processing method for large flat mirror in Ritchey-Common test[J]. Jounal of Applied Optics,2015,36(5):698-704. (in Chinese)

    [8] JIANG T, YANG W, GUO Y B, et al.. Mid-spatial frequency error identification of precision optical surface based on empirical mode decomposition-Wigner-Ville distribution[J]. High Power Laser and Partical Beams, 2014, 26(3):032003-1-032003-7. (in Chinese)

    [9] de GROOT P. Principles of interference microscopy for the measurement of surface topography[J]. Advances in Optics and Photonics,2015, 7:1-65.

    [10] MA CH T, LUO H X, WANG J, et al.. Surface error measurement of plane mirrors based on oblique incidence[J]. Laser&Optoelectronics Progress,2011(7):071201-1-071201-7. (in Chinese)

    [11] LIU ZH D, CHEN L, HAN ZH G. Measurement of large aperture SiC flat mirrors by oblique incidence interferometry[J]. Opt. Precision Eng.,2011, 19(7):1437-1444. (in Chinese)

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    XU Long-bo, ZHOU You, ZHU Ri-hong, LIU Shi-jie, ZHENG Wan-guo. Measurement and calculation for reflective wavefront error of large optics at oblique incidence[J]. Optics and Precision Engineering, 2016, 24(12): 3027
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