A low-cost and efficient parameter test system for infrared focal plane arrays(IRFPA) was introduced. The test bench including control module, blackbody, UFPA module, signal acquisition module and the host computer program was established and the critical technologies of this system were analyzed. This system can realize real-time signal acquisition, and at the same time it can be used to analyze some important parameters, such as root mean square noise, nonuniformity, responsivity, detectivity, noise equivalent power (NEP) and noise equivalent temperature difference (NETD), and so on. This system also can accurately determine the number and location of bad pixels, analyze, assess, and store the performance parameters of each good pixel of devices.