• Optics and Precision Engineering
  • Vol. 31, Issue 2, 141 (2023)
Xiaoqian NIU1,2, Pengfei MIAO3, Hanlin WANG1,2, Xiaodong WANG1, and Bo CHEN1,*
Author Affiliations
  • 1Changchun Institute of Optics,Fine Mechanicsand Physics,Chinese Academy of Sciences, Changchun3003, China
  • 2University of Chinese Academy of Sciences, Beijing100190, China
  • 3Shanghai Institute of Satellite Engineering, Shanghai200240, China
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    DOI: 10.37188/OPE.20233102.0141 Cite this Article
    Xiaoqian NIU, Pengfei MIAO, Hanlin WANG, Xiaodong WANG, Bo CHEN. Preparation of EUV Filter at 17.1 nm[J]. Optics and Precision Engineering, 2023, 31(2): 141 Copy Citation Text show less
    Schematic of transmission filter
    Fig. 1. Schematic of transmission filter
    Absorption coefficient and trasmission of different materials
    Fig. 2. Absorption coefficient and trasmission of different materials
    Transmission of 150 nm Al in visible
    Fig. 3. Transmission of 150 nm Al in visible
    Transmission of Al with different thicknesses
    Fig. 4. Transmission of Al with different thicknesses
    Preparation of filter
    Fig. 5. Preparation of filter
    Al filter sample with mesh supported
    Fig. 6. Al filter sample with mesh supported
    Surface topography of mesh-support filter under microscope
    Fig. 7. Surface topography of mesh-support filter under microscope
    Comparison between the transmission of ESP and sample
    Fig. 8. Comparison between the transmission of ESP and sample
    [in Chinese]
    Fig. 9. [in Chinese]
    Comparison between simulated transmission and measured transmission of filter
    Fig. 10. Comparison between simulated transmission and measured transmission of filter
    XPS survey of the Al film on the surfaces
    Fig. 11. XPS survey of the Al film on the surfaces
    Pinholes on the surface of a filter
    Fig. 12. Pinholes on the surface of a filter
    Transmission of the filter in visible region
    Fig. 13. Transmission of the filter in visible region
    TimeRoughness/nmThickness of oxide layer/nmTransmission at 17.1 nm/%
    Day12.565.5245.35
    Day22.776.4642.75
    Day32.726.6142.34
    Table 1. [in Chinese]
    NamePeak BEHeight CPSFWHM/eVArea(P) CPS/eVAtomic/%
    O1s531.41 193 5164.035 098 38532.98
    N1s400.053 6424.8930 055.320.31
    C1s284.95155 897.34.18746 587.312.12
    Al2s118.22289 219.54.871 480 89227.8
    Al2p73.36204 248.54.861 016 99826.79
    Table 2. Atomic ratio on the surface of the thin films
    Xiaoqian NIU, Pengfei MIAO, Hanlin WANG, Xiaodong WANG, Bo CHEN. Preparation of EUV Filter at 17.1 nm[J]. Optics and Precision Engineering, 2023, 31(2): 141
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