[1] P. K. Sahoo, S. Soltani, A. K. C. Wong, and Y. C. Chen, Comput. Vis. Graph. Image Process. 41, 233 (1988).
[2] J. S. Weszka, Comput. Vis. Graph. Image. Process. 7, 259 (1978).
[3] D. A. Clausi, Pattern Recogn. 35, 1959 (2002).
[4] A. K. Jain, R. P. W. Duin, and J. Mao, IEEE Trans. Pattern Anal. Mach. Intell. 22, 4 (2000).
[5] J. Gambini, M. E. Mejail, J. Jacobo-Berlles, and A. C. Frery, Stat. Comput. 18, 15 (2008).
[6] S. A. Hojjatoleslami and J. Kittler, IEEE Trans. Image Process. 7, 1079 (1998).
[7] M. S. Allili and D. Ziou, Pattern Recogn. Lett. 28, 1946 (2007).
[8] C. Bouman and B. Liu, IEEE Trans. Pattern Anal. Mach. Intell. 13, 99 (1991).
[9] C. A. Bouman and M. Shapiro, IEEE Trans. Image Process. 3, 162 (1994).
[10] M. Mignotte, C. Collet, P. Perez, and P. Bouthemy, IEEE Trans. Image Process. 9, 1216 (2000).
[11] C. H. Fosgate, W. W. Irving, W. C. Karl, and A. S. Willsky, IEEE Trans. Image Process. 6, 7 (1997).
[12] W. W. Irving, L. M. Novak, and A. S. Willsky, IEEE Trans. Aero. Electron. Syst. 33, 1157 (1997).
[13] A. Kim and H. Krim, IEEE Trans. Signal Process. 47, 458 (1999).
[14] M. Basseville, A. Benveniste, and A. S. Willsky, IEEE Trans. Signal Process. 40, 1915 (1992).
[15] M. Basseville, A. Benveniste, and A. S. Willsky, IEEE Trans. Signal Process. 40, 1935 (1992).
[16] A. Alonso-Gonzalez, C. Lopez-Martinez, and P. Salembier, in Proceedings of 2010 IEEE International Geoscience and Remote Sensing Symposium 4043 (2010).
[17] M. L. Comer and E. J. Delp, IEEE Trans. Image Process. 8, 408 (1999).
[18] X. B. Wen and Z. Tian, Electron. Lett. 39, 1272 (2003).
[19] B. Efron, Ann. Stat. 7, 1 (1979).