[1] H. Zhang, J. Xie, J. Liu, Y. Wang. Appl. Opt., 48, 5834(2009).
[2] H. Zhang, Q. Tan, G. Jin. Opt. Eng., 51, 075801(2012).
[3] H. Zhang, N. Collings, J. Chen, B. A. Crossland, D. Chu, J. Xie. Opt. Eng., 50, 074003(2011).
[4] J. Jia, Y. Wang, J. Liu, X. Li, Y. Pan. Proc. SPIE, 8557, 85570B(2012).
[5] Y. Ichihashi, R. Oi, T. Senoh, K. Yamamoto, T. Kurita. Opt. Express, 20, 21645(2012).
[6] A. D. Stein, Z. Wang, J. S. Leigh. Comput. Phys., 6, 389(1992).
[7] M. Lucente. J. Electron. Imaging, 2, 28(1993).
[10] Y. Zhang, P. Wang, H. Chen, Y. Xu, W. Chen, W. X. Chin. Chin. Opt. Lett., 12, 030902(2014).
[11] J. Jia, Y. Wang, J. Liu, X. Li, J. Xie. Laser Optoelectron. Prog., 49, 050002(2012).
[12] T. Shimobaba, T. Ito, N. Masuda, Y. Ichihashi, N. Takada. Opt. Express, 18, 9955(2010).
[13] L. Ahrenberg, P. Benzie, M. Magnor, J. Watson. Opt. Express, 14, 7636(2006).
[14] Y. Pan, X. Xu, X. Liang. Appl. Opt., 52, 6562(2013).
[16] D. Merrill, A. Grimshaw. Parallel Process Lett., 21, 245(2011).
[17] J. Dong, F. Wang, B. Yuan. Lect. Notes Comput. Sci., 8206, 409(2013).
[18] J. Wang, S. Yalamanchili. Proceedings of the IEEE International Symposium on Workload Characterization(2014).
[19] Z. Sun. Comput. Knowl. Technol., 9, 4363(2013).