A Bayesian Method for Residual Lifetime Prediction Based on Random Wiener Process

CAI Zhong-yi; CHEN Yun-xiang; ZHANG Liang; ZHANG Lang-jun

doi:10. 3969/j. issn. 1671 -637x. 2016.07.020

Journals >Electronics Optics & Control >Volume 23 >Issue 7 >Page 93 > Article

Electronics Optics & Control
Vol. 23, Issue 7, 93 (2016)

A Bayesian Method for Residual Lifetime Prediction Based on Random Wiener Process

CAI Zhong-yi¹, CHEN Yun-xiang¹, ZHANG Liang², and ZHANG Lang-jun³

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10. 3969/j. issn. 1671 -637x. 2016.07.020 Cite this Article

CAI Zhong-yi, CHEN Yun-xiang, ZHANG Liang, ZHANG Lang-jun. A Bayesian Method for Residual Lifetime Prediction Based on Random Wiener Process[J]. Electronics Optics & Control, 2016, 23(7): 93 Copy Citation Text

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References

[4] WANG X．Wiener processes with random effects for degradation data［J］. Journal of Multivariate Analysis, 2010, 101(2): 340-351.

[5] TANG S J, YU C Q, WANG X, et al. Remaining useful life prediction of lithium-ion batteries based on the Wiener process with measurement error ［J］. Energies, 2014, 7(2): 520-547.

CAI Zhong-yi, CHEN Yun-xiang, ZHANG Liang, ZHANG Lang-jun. A Bayesian Method for Residual Lifetime Prediction Based on Random Wiener Process[J]. Electronics Optics & Control, 2016, 23(7): 93

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