• Optoelectronics Letters
  • Vol. 18, Issue 2, 103 (2022)
[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]3, [in Chinese]1, [in Chinese]4、*, [in Chinese]4, [in Chinese]4, [in Chinese]4, [in Chinese]4, and [in Chinese]4
Author Affiliations
  • 1Tianjin Key Laboratory for Control Theory and Applications in Complicated Systems, School of Electrical Engineering and Automation, Tianjin University of Technology, Tianjin 300384, China
  • 2School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou 510006, China
  • 3China Academy of Launch Vehicle Technology, Beijing 100076, China
  • 4School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China
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    DOI: 10.1007/s11801-022-1024-y Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Estimating the quality of stripe in structured light 3D measurement[J]. Optoelectronics Letters, 2022, 18(2): 103 Copy Citation Text show less
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Estimating the quality of stripe in structured light 3D measurement[J]. Optoelectronics Letters, 2022, 18(2): 103
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