[1] Levoy M, Hanrahan P. Light field rendering[J]. Computer Graphics, 31-42(1996).
[2] Levoy M, Ng R, Adams A et al. Light field microscopy[J]. ACM Transactions on Graphics, 25, 924-934(2006).
[3] Xia Z Y, Tian Y Z, Liang E J et al. Infrared light field imaging based on camera array[J]. Acta Optica Sinica, 37, 0911002(2017).
[4] Wang W F, Zhang Y X, Chen Y et al. Wide field-of-view image stitching algorithm based on depth sequence of light field[J]. Acta Optica Sinica, 38, 0915003(2018).
[5] Wilburn B, Joshi N, Vaish V et al. High performance imaging using large camera arrays[J]. ACM Transactions on Graphics, 24, 765-776(2005). http://dl.acm.org/citation.cfm?id=1073259
[6] Liang C K, Lin T H, Wong B Y et al. Programmable aperture photography: multiplexed light field acquisition[J]. ACM Transactions on Graphics, 27, 55(2008). http://dl.acm.org/citation.cfm?id=1360612.1360654
[7] Veeraraghavan A, Raskar R, Agrawal A et al. Dappled photography: mask enhanced cameras for heterodyned light fields and coded aperture refocusing[J]. ACM Transactions on Graphics, 26, 69(2007). http://dl.acm.org/citation.cfm?id=1276463
[8] Ng R, Levoy M, Brédif M et al. Light field photography with a handheld plenoptic camera[J]. Stanford Technical Report CSTR, 1-11(2005).
[9] Zhang C, Liu F, Hou G Q et al. Light field photography and its application in computer vision[J]. Journal of Image and Graphics, 21, 263-281(2016).
[10] Bishop T E, Favaro P. The light field camera: extended depth of field, aliasing, and superresolution[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 34, 972-986(2012). http://doi.ieeecomputersociety.org/10.1109/TPAMI.2011.168
[11] Wanner S, Goldluecke B. Globally consistent depth labeling of 4D light fields. [C]∥2012 IEEE Conference on Computer Vision and Pattern Recognition, June 16-21, 2012, Providence, RI, USA, 41-48(2012).
[12] Tao M W, Hadap S, Malik J et al. Depth from combining defocus and correspondence using light-field cameras. [C]∥2013 IEEE International Conference on Computer Vision (ICCV), December 1-8, 2013, Sydney, NSW, Australia. New York: IEEE, 673-680(2013).
[13] Lin H T, Chen C, Kang S B et al. Depth recovery from light field using focal stack symmetry. [C]∥2015 IEEE International Conference on Computer Vision (ICCV), December 7-13, 2015, Santiago, Chile. New York: IEEE, 3451-3459(2015).
[14] Zhang Y B, Lü H, Liu Y B et al. Light-field depth estimation via epipolar plane image analysis and locally linear embedding[J]. IEEE Transactions on Circuits and Systems for Video Technology, 27, 739-747(2017). http://www.onacademic.com/detail/journal_1000039071880610_c901.html
[15] Chen Y Q, Jin X, Dai Q H. Distance measurement based on light field geometry and ray tracing[J]. Optics Express, 25, 59-76(2017). http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-25-1-59
[16] Salvi J, Fernandez S, Pribanic T et al. A state of the art in structured light patterns for surface profilometry[J]. Pattern Recognition, 43, 2666-2680(2010). http://dl.acm.org/citation.cfm?id=1787136
[17] Geng J. Structured-light 3D surface imaging: a tutorial[J]. Advances in Optics and Photonics, 3, 128-160(2011). http://www.opticsinfobase.org/abstract.cfm?URI=aop-3-2-128
[18] Peng X, Yin Y K, Liu X L et al. Phase-aided three-dimensional imaging and metrology[J]. Acta Optica Sinica, 31, 0900120(2011).
[19] Su X Y, Zhang Q C, Chen W J. Three-dimensional imaging based on structured illumination[J]. Chinese Journal of Lasers, 41, 0209001(2014).
[20] Cai Z W, Liu X L, Peng X et al. Structured light field 3D imaging[J]. Optics Express, 24, 20324-20334(2016). http://europepmc.org/abstract/MED/27607639
[21] Cai Z W, Liu X L, Peng X et al. Ray calibration and phase mapping for structured-light-field 3D reconstruction[J]. Optics Express, 26, 7598-7613(2018). http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-26-6-7598
[22] Gershun A. The light field[J]. Journal of Mathematics and Physics, 18, 51-151(1939).
[23] Adelson E H, Bergen J R[M]. The plenoptic function and the elements of early vision, 3-20(1991).
[24] Ng R. Fourier slice photography[J]. ACM Transactions on Graphics, 24, 735-744(2005).
[25] Yu X Y, Wu H B, Yin L P et al. 3D measurement technology based on structured light by combining gray code with phase-shift[J]. Chinese Journal of Scientific Instrument, 28, 2152-2157(2007).