Thermal Stability of Mid-infrared SiO2 Thin Films Deposited by Dual Ion Beam Sputtering Method

SHANG Peng; JI Yi-qin; ZHAO Dao-ling; XIONG Sheng-ming; LIU Hua-song; LI Ling-hui; TIAN Dong

doi:10.3788/gzxb20174608.0816003

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