• High Power Laser Science and Engineering
  • Vol. 5, Issue 2, 02000e10 (2017)
Bingchi Luo1,2, Jiqiang Zhang1, Yudan He1, Long Chen1..., Jiangshan Luo1,2, Kai Li1,2 and Weidong Wu1,2,†|Show fewer author(s)
Author Affiliations
  • 1Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang621900, China
  • 2Science and Technology on Plasma Physics Laboratory, Mianyang621900, China
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    DOI: 10.1017/hpl.2017.8 Cite this Article Set citation alerts
    Bingchi Luo, Jiqiang Zhang, Yudan He, Long Chen, Jiangshan Luo, Kai Li, Weidong Wu, "An investigation progress toward Be-based ablator materials for the inertial confinement fusion," High Power Laser Sci. Eng. 5, 02000e10 (2017) Copy Citation Text show less
    Be–Cu capsule. (a) Optical microscope image, (b) SEM image, (c) micro-CT image, (d) polished cross-section morphology, (e) cross-section morphology, (f) Cu dopant distribution at cross-section.
    Fig. 1. Be–Cu capsule. (a) Optical microscope image, (b) SEM image, (c) micro-CT image, (d) polished cross-section morphology, (e) cross-section morphology, (f) Cu dopant distribution at cross-section.
    Be coating morphologies. (a), (b) and (c) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by thermal evaporation, (d), (e) and (f) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by reactive evaporation.
    Fig. 2. Be coating morphologies. (a), (b) and (c) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by thermal evaporation, (d), (e) and (f) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by reactive evaporation.
    XPS spectra for films prepared at different $\text{CH}_{4}$–Ar ratios after 30 min $\text{Ar}^{+}$ etching survey spectrum (a), deconvolution of Be1s peaks (b) and deconvolution of C1s peaks (c).
    Fig. 3. XPS spectra for films prepared at different $\text{CH}_{4}$–Ar ratios after 30 min $\text{Ar}^{+}$ etching survey spectrum (a), deconvolution of Be1s peaks (b) and deconvolution of C1s peaks (c).
    (a) High-resolution TEM image and corresponding FFT pattern (inset upper right) for film deposited at room temperature, (b) typical XRD pattern of films with in situ annealing.
    Fig. 4. (a) High-resolution TEM image and corresponding FFT pattern (inset upper right) for film deposited at room temperature, (b) typical XRD pattern of films with in situ annealing.
    Typical surface and cross-sectional morphologies of $\text{Be}_{2}\text{C}$ films with different thickness: (a) and (b) surface morphologies by AFM, (a1) and (b1) cross-sectional morphologies by SEM.
    Fig. 5. Typical surface and cross-sectional morphologies of $\text{Be}_{2}\text{C}$ films with different thickness: (a) and (b) surface morphologies by AFM, (a1) and (b1) cross-sectional morphologies by SEM.
    Typical optical transmittance spectra of the $\text{Be}_{2}\text{C}$ films and corresponding photograph (inset).
    Fig. 6. Typical optical transmittance spectra of the $\text{Be}_{2}\text{C}$ films and corresponding photograph (inset).
    SEM micrograph of compressed Be powders.
    Fig. 7. SEM micrograph of compressed Be powders.
    ImpuritiesContentCharacterization methods
    Al34.7 ppmICP-AES
    Fe23.8 ppmICP-AES
    Mn0.045 ppmICP-MS
    Ni0.33 ppmICP-MS
    Cr0.9 ppmICP-MS
    Ga0.25 ppmICP-MS
    Co0.41 ppmICP-MS
    Mo0.32 ppmICP-MS
    Sb0.048 ppmICP-MS
    O0.82 at.%LECO
    C2.22 at.%LECO
    Table 1. The content of impurities in Be powder.
    Bingchi Luo, Jiqiang Zhang, Yudan He, Long Chen, Jiangshan Luo, Kai Li, Weidong Wu, "An investigation progress toward Be-based ablator materials for the inertial confinement fusion," High Power Laser Sci. Eng. 5, 02000e10 (2017)
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