• High Power Laser Science and Engineering
  • Vol. 5, Issue 2, 02000e10 (2017)
Bingchi Luo1、2, Jiqiang Zhang1, Yudan He1, Long Chen1, Jiangshan Luo1、2, Kai Li1、2, and Weidong Wu1、2、†
Author Affiliations
  • 1Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang621900, China
  • 2Science and Technology on Plasma Physics Laboratory, Mianyang621900, China
  • show less
    DOI: 10.1017/hpl.2017.8 Cite this Article Set citation alerts
    Bingchi Luo, Jiqiang Zhang, Yudan He, Long Chen, Jiangshan Luo, Kai Li, Weidong Wu. An investigation progress toward Be-based ablator materials for the inertial confinement fusion[J]. High Power Laser Science and Engineering, 2017, 5(2): 02000e10 Copy Citation Text show less
    Be–Cu capsule. (a) Optical microscope image, (b) SEM image, (c) micro-CT image, (d) polished cross-section morphology, (e) cross-section morphology, (f) Cu dopant distribution at cross-section.
    Fig. 1. Be–Cu capsule. (a) Optical microscope image, (b) SEM image, (c) micro-CT image, (d) polished cross-section morphology, (e) cross-section morphology, (f) Cu dopant distribution at cross-section.
    Be coating morphologies. (a), (b) and (c) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by thermal evaporation, (d), (e) and (f) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by reactive evaporation.
    Fig. 2. Be coating morphologies. (a), (b) and (c) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by thermal evaporation, (d), (e) and (f) surface microstructure, cross-section microstructure and XRD pattern of Be coating prepared by reactive evaporation.
    XPS spectra for films prepared at different $\text{CH}_{4}$–Ar ratios after 30 min $\text{Ar}^{+}$ etching survey spectrum (a), deconvolution of Be1s peaks (b) and deconvolution of C1s peaks (c).
    Fig. 3. XPS spectra for films prepared at different $\text{CH}_{4}$–Ar ratios after 30 min $\text{Ar}^{+}$ etching survey spectrum (a), deconvolution of Be1s peaks (b) and deconvolution of C1s peaks (c).
    (a) High-resolution TEM image and corresponding FFT pattern (inset upper right) for film deposited at room temperature, (b) typical XRD pattern of films with in situ annealing.
    Fig. 4. (a) High-resolution TEM image and corresponding FFT pattern (inset upper right) for film deposited at room temperature, (b) typical XRD pattern of films with in situ annealing.
    Typical surface and cross-sectional morphologies of $\text{Be}_{2}\text{C}$ films with different thickness: (a) and (b) surface morphologies by AFM, (a1) and (b1) cross-sectional morphologies by SEM.
    Fig. 5. Typical surface and cross-sectional morphologies of $\text{Be}_{2}\text{C}$ films with different thickness: (a) and (b) surface morphologies by AFM, (a1) and (b1) cross-sectional morphologies by SEM.
    Typical optical transmittance spectra of the $\text{Be}_{2}\text{C}$ films and corresponding photograph (inset).
    Fig. 6. Typical optical transmittance spectra of the $\text{Be}_{2}\text{C}$ films and corresponding photograph (inset).
    SEM micrograph of compressed Be powders.
    Fig. 7. SEM micrograph of compressed Be powders.
    ImpuritiesContentCharacterization methods
    Al34.7 ppmICP-AES
    Fe23.8 ppmICP-AES
    Mn0.045 ppmICP-MS
    Ni0.33 ppmICP-MS
    Cr0.9 ppmICP-MS
    Ga0.25 ppmICP-MS
    Co0.41 ppmICP-MS
    Mo0.32 ppmICP-MS
    Sb0.048 ppmICP-MS
    O0.82 at.%LECO
    C2.22 at.%LECO
    Table 1. The content of impurities in Be powder.
    Bingchi Luo, Jiqiang Zhang, Yudan He, Long Chen, Jiangshan Luo, Kai Li, Weidong Wu. An investigation progress toward Be-based ablator materials for the inertial confinement fusion[J]. High Power Laser Science and Engineering, 2017, 5(2): 02000e10
    Download Citation