Depth-of-investigation characteristics and influence of 350-kV high-voltage X-ray density logging

Hu WANG; Rui LIU; Aizhong YUE; Huawei YU; Xiaolei ZHANG; Zhengchun YANG; Qian ZHU; Zhiqiang GUO

doi:10.11889/j.0253-3219.2023.hjs.46.100502

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