• Opto-Electronic Engineering
  • Vol. 30, Issue 5, 28 (2003)
[in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Polarization Coupling with White Light Interferometry and Analysis for Data Sampling[J]. Opto-Electronic Engineering, 2003, 30(5): 28 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Polarization Coupling with White Light Interferometry and Analysis for Data Sampling[J]. Opto-Electronic Engineering, 2003, 30(5): 28
    Download Citation