[1] H. Kurita, K. Saito, M. Kato, and T. Yatagai, Proc. SPIE 680, 47 (1986).
[2] J. Ruckman, E. Fess, and D. Van Gee, Proc. SPIE 3782, 2 (1999).
[4] Y.-M. Liu, G. N. Lawrence, and C. L. Koliopoulos, Appl. Opt. 27, 4504 (1988).
[5] X. Hou, F. Wu, L. Yang, S. Wu, and Q. Chen, Chin. Opt. Lett. 4, 211 (2006).
[6] X. Hou, F. Wu, L. Yang, S. Wu, and Q. Chen, Appl. Opt. 45, 3442 (2006).
[7] M. Melozzi, L. Pezzati, and A. Mazzoni, Opt. Eng. 32, 1073 (1993).
[8] X. Wang and X. Zhang, Opt. Technique (in Chinese) 32, 673 (2006).
[9] F. Granados-Agustin, F. Escobar-Romero, and A. C. Rodriguez, Proc. SPIE 4829, 44 (2003).
[10] X. Wang, X. Zhang, L. Wang, and L. Zheng, Opt. Precision Eng. (in Chinese) 14, 527 (2006).