[1] S. Jacobi, B. Steeg, J. Wiesmann, M. Stormer, J. Feldhaus, R. Bormann, and C. Michaelsen, Proc. SPIE 4782, 113 (2002).
[2] http://www-cxro.lbl.gov/als6.3.2/.
[3] F. M. d'Heurle, Metall. Teans. 1, 725 (1970).
[4] F. M. d'Heurle and J. M. E. Harper, Thin Solid Films 171, 81 (1989).
[5] H. Windischmann, J. Appl. Phys. 62, 1800 (1987).
[6] C. A. Davis, Thin Solid Films 226, 30 (1993).
[7] E. Mounier and Y. Pauleau, J. Vac. Sci. Technol. A 14, 2535 (1996).
[10] E. Mounier and Y. Pauleau, Diamond. Relat. Mater. 6, 1182 (1997).
[11] D. L. Windt, Computers in Physics 12, 360 (1998).
[12] D. Henderson, M. H. Brodsky, and P. Chaudhari, Appl. Phys. Lett. 25, 641 (1974).
[13] O. Durand-Drouhin and M. Benlahsen, Solid State Commun. 131, 425 (2004).