CALIBRATION OF THE NON-LINEARITY OF PIEZO ELEMENTS AND IMAGE DISTORTION IN ATOMIC FORCE MICROSCOPE

[in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 31 >Issue 10 >Page 1252 > Article

Acta Photonica Sinica
Vol. 31, Issue 10, 1252 (2002)

CALIBRATION OF THE NON-LINEARITY OF PIEZO ELEMENTS AND IMAGE DISTORTION IN ATOMIC FORCE MICROSCOPE

[in Chinese] and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese]. CALIBRATION OF THE NON-LINEARITY OF PIEZO ELEMENTS AND IMAGE DISTORTION IN ATOMIC FORCE MICROSCOPE[J]. Acta Photonica Sinica, 2002, 31(10): 1252 Copy Citation Text

show less

References

[1] Binnig G,Rohrer H.Scanning tunneling microscopy.Helev Phys Acta,1982,55(4):726～729

[2] Binnig G,Quate C F.Atomic force microscopy.Phys Rev Lett,1986,56(5):930～935

[3] Kawakatsu H,Higuchi T.A dual tunneling-unit scanning tunneling microscopy.J Vac Sci Technol,1990,A8(1):319～322

[in Chinese], [in Chinese]. CALIBRATION OF THE NON-LINEARITY OF PIEZO ELEMENTS AND IMAGE DISTORTION IN ATOMIC FORCE MICROSCOPE[J]. Acta Photonica Sinica, 2002, 31(10): 1252

Download Citation

Tools

Save the article for my favorites

Paper Information