WU Chun-ting, LI He, CAI Ji-xing, TAN Yong, JIN Guang-yong. Measurement of real-time stress damage of monocrystal silicon by Mach-Zehnder interferometry[J]. Optics and Precision Engineering, 2017, 25(5): 1395

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- Optics and Precision Engineering
- Vol. 25, Issue 5, 1395 (2017)
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