[1] O. Madelung, (ed.) Semiconductors: Data Handbook (3rd edn.) (Springer, Berlin, 2004).
[2] C. Chen and H. Qi, Acta Opt. Sin. (in Chinese) 28, 1411 (2008).
[3] H. Yu, B. Li, R. Zhang, X. Xiu, Z. Xie, Y. Ye, M. Zhang, Q. Chen, and J. Shen, Acta Opt. Sin. (in Chinese) 29, 1324 (2009).
[4] F. Zhang, Z. Zhang, W. Zhang, J. Yan, and J. Yun, Acta Opt. Sin. (in Chinese) 29, 1025 (2009).
[5] Y. Zhang, S.-Q. Wu, Y.-H. Wen, and Z.-Z. Zhu, Appl. Phys. Lett. 96, 223113 (2010).
[6] D. C. Look, Mater. Sci. Eng. B 80, 383 (2001).
[7] S.-H. Wei, Comput. Mater. Sci. 30, 337 (2004).
[8] D. J. Chadi and K. J. Chang, Phys. Rev. B 39, 10063 (1989).
[9] C. H. Park, S. B. Zhang, and S.-H. Wei, Phys. Rev. B 66, 073202 (2002).
[10] Y. Yan, M. M. Al-Jassim, and S.-H. Wei, Appl. Phys. Lett. 89, 181912 (2006).
[11] X. Li, S. E. Asher, S. Limpijumnong, B. M. Keyes, C. L. Perkins, T. M. Barnes, H. R. Moutinho, J. M. Luther, S. B. Zhang, S.-H. Wei, and T. J. Coutts, J. Cryst. Growth 287, 94 (2006).
[12] J. L. Lyons, A. Janotti, and C. G. Van de Walle, Appl. Phys. Lett. 95, 252105 (2009).
[13] A. N. Gruzintsev, V. T. Volkov, I. I. Khodos, T. V. Nikiforova, and M. N. Koval’chuk, Russ. Microelectron. 31, 200 (2002).
[14] Q. Wan, Z. Xiong, J. Dai, J. Rao, and F. Jiang, Opt. Mater. 30, 817 (2008).
[15] H. S. Kang, B. D. Ahn, J. H. Kim, G. H. Kim, S. H. Lim, H. W. Chang, and S. Y. Lee, Appl. Phys. Lett. 88, 202108 (2006).
[16] C. Zuo, J. Wen, S. Zhu, and C. Zhong, Opt. Mater. 32, 595 (2010).
[17] S. Duan, N. Tan, Z. Miao, Z. Liu, and Q. Zhang, Acta Opt. Sin. (in Chinese) 26, 311 (2006).
[18] T. Yamamoto, Thin Solid Films 420-421, 100 (2002).
[19] L. G. Wang and A. Zunger, Phys. Rev. Lett. 90, 256401 (2003).
[20] A. Schleife, F. Fuchs, J. Furthm¨uller, and F. Bechstedt, Phys. Rev. B 73, 245212 (2006).
[21] A. Janotti, D. Segev, and C. G. Van de Walle, Phys. Rev. B 74, 045202 (2006).
[22] S. B. Zhang and J. E. Northrup, Phys. Rev. Lett. 67, 2339 (1991).
[23] J. Sun, H.-T. Wang, J. He, and Y. Tian, Phys. Rev. B 71, 125132 (2005).
