• OPTICS & OPTOELECTRONIC TECHNOLOGY
  • Vol. 21, Issue 3, 46 (2023)
LIUGang, HUANGHua-feng, ZHANGYuan-ming, CHENChen..., ZHUANGHai-lu and GONGJin|Show fewer author(s)
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    DOI: Cite this Article
    LIUGang, HUANGHua-feng, ZHANGYuan-ming, CHENChen, ZHUANGHai-lu, GONGJin. ResearchonElectricFieldMonitoringMethodof10kVT-Type CableJointUnderWetDefect[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2023, 21(3): 46 Copy Citation Text show less
    References

    [3] GZhiwei, W.Yu, X.Zitao, W.Fuwang. Researchonon-linemonitoringtechnologyofmechanicalcharacteristicsof ring network cabinet[C]. Proc. 2020 IEEE International Conference on Power, Intelligent Computing and Systems(ICPICS), 2020, 67-71.

    [8] C Chang, C Lai, R Wu. Decision tree rules for insulation condition assessment of pre-molded power cable joints withartificialdefects[J]. IEEETransactionsonDielectricsandElectricalInsulation, 2019, 26(5):1636-1644.

    [9] C K Chang, B K Boyanapalli, R N Wu. Application of fuzzy entropy to improve feature selection for defect recognition using support vector machine in high voltage cable joints[J]. IEEE Transactions on Dielectrics and ElectricalInsulation, 2020, 27(6):2147-2155.

    [10] JYu, X Chen, H Zhou. Electric field calculation and optimization for stress cone of DC cable joint based on the coaxialdouble-layerinsulationmodel[J]. IEEETransactionsonDielectricsandElectricalInsulation, 2020, 27(1): 33-41.

    [15] YZhou, YWang, WWang. Astudy onthepropagationcharacteristicsofpartialdischargeincablejointsbased on theFDTDmethod[J]. IEEEAccess, 2020, (8):130094-130103.

    [18] B Ngarmchuen, Y Kongjeen, B Plangklang, et al. The Effect of Electric Field from the Cable Joint to the Breakdown of Insulation in 24 kV Underground Cables[C]. Proc. 2021 9th International Electrical Engineering Congress(iEECON), 2021, 45-48.

    LIUGang, HUANGHua-feng, ZHANGYuan-ming, CHENChen, ZHUANGHai-lu, GONGJin. ResearchonElectricFieldMonitoringMethodof10kVT-Type CableJointUnderWetDefect[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2023, 21(3): 46
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