• Chinese Journal of Lasers
  • Vol. 40, Issue 12, 1207001 (2013)
Liu Yu1、*, Zhang Haitao1, Xu Shuping2, and Xu Weiqing2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/cjl201340.1207001 Cite this Article Set citation alerts
    Liu Yu, Zhang Haitao, Xu Shuping, Xu Weiqing. Study on the Effect of Refractive Index and Metal Film Thickness on Surface Plasmon Resonance Field Enhanced Surface-Enhanced Raman Scattering[J]. Chinese Journal of Lasers, 2013, 40(12): 1207001 Copy Citation Text show less

    Abstract

    The effects of dielectric refractive index, prism refractive index and metal film thickness on the surface plasmon resonance (SPR) field enhanced surface-enhanced Raman scattering (SERS) with Kretschmann SPR configuration are studied. Experimental results show that SPR and SERS are essentially correlative. The dielectric refractive index, prism refractive index and metal film thickness have a large effect on SPR field enhanced SERS. Under the same condition, when the dielectric refractive index is small, the SPR field used for SERS signal enhancement and the SERS are great. When the prism refractive index is great, the SPR field enhanced SERS is great. When the silver film thickness increases, the SERS signal intensity increases at first, and then decreases after the SERS signal reaches the largest value. When the silver film thickness is about 47 nm, the SERS signal is the largest.
    Liu Yu, Zhang Haitao, Xu Shuping, Xu Weiqing. Study on the Effect of Refractive Index and Metal Film Thickness on Surface Plasmon Resonance Field Enhanced Surface-Enhanced Raman Scattering[J]. Chinese Journal of Lasers, 2013, 40(12): 1207001
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