• Optics and Precision Engineering
  • Vol. 21, Issue 10, 2549 (2013)
YANG Yan-rong1,*, YANG Ren-jie1, ZHANG Zhi-yong1, DONG Gui-mei1, and YANG Shi-chun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20132110.2549 Cite this Article
    YANG Yan-rong, YANG Ren-jie, ZHANG Zhi-yong, DONG Gui-mei, YANG Shi-chun. Discrimination of adulterated milk based on infrared spectroscopy and K-OPLS[J]. Optics and Precision Engineering, 2013, 21(10): 2549 Copy Citation Text show less

    Abstract

    To detect adulterated milk rapidly and accurately, the discrimination models for adulterated milk were established based on the method of Kernel Orthogonal Projection to Latent Structure (K-OPLS). By using the Gaussian radial basis function as the kernel function and the minimum value of Root Mean Square Errors of Cross-validation (RMSECV)as an evaluation index, the width of the Gaussian kernel, the minimum value of the RMSECV, and the number of Y-orthogonal components (scalar) were selected in a optimization. 36 samples with different concentrations of tetracycline (0.01-0.3 gL-1), melamine (0.01-0.3 gL-1) and glucose (0.01-0.3 gL-1) in milk were prepared, respectively. Then the infrared absorption spectra of all samples were measured. K-OPLS models for tetracycline-tainted milk, melamine-tainted milk and glucose-tainted milk were constructed. The results show that its classification accuracy for tetracycline-tainted milk, melamine-tainted milk and glucose-tainted milk are 100%,100%,95.8%, respectively. The K-OPLS model was used to classify the above three kinds of adulterated milk and pure milk and its classification accuracy for unknown samples is 93.1%. Compared with Partial Least Square Discriminant Analysis (PLS-DA), K-OPLS methods show higher accuracy. The results indicate that the K-OPLS model has good prediction ability for complex milk systems.
    YANG Yan-rong, YANG Ren-jie, ZHANG Zhi-yong, DONG Gui-mei, YANG Shi-chun. Discrimination of adulterated milk based on infrared spectroscopy and K-OPLS[J]. Optics and Precision Engineering, 2013, 21(10): 2549
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