• Acta Photonica Sinica
  • Vol. 31, Issue 7, 887 (2002)
1, 1, 1, 1..., 1, 1, 1 and 2|Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. ANALYSIS OF THE SURFACE SHAPE IN SOLIDETCHING PROCESS[J]. Acta Photonica Sinica, 2002, 31(7): 887 Copy Citation Text show less
    References

    [1] Hamaguchi S,Dalvie M,Farouki R T,et al.A shock-tracking algorithm for surface evolution under reactive-ion etching.J Appl Phys,1993,74(8):5172~5184

    [2] Smith R,Wilde S J.The simulation of two-dimensional surface erosion and deposition processes.J Vac Sci Technol(B),1987,5(2):579~585

    [3] Gratrix E J.Evolution of a microlens surface under etching conditions.SPIE,1993,1992:266~274

    [4] Gallatin G M,Zarowin C B.Unified approach to the temporal evolution of surface profiles in solid etch and deposition processes.J Appl Phys,1989,65(12):5078~5088

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. ANALYSIS OF THE SURFACE SHAPE IN SOLIDETCHING PROCESS[J]. Acta Photonica Sinica, 2002, 31(7): 887
    Download Citation