Fig. 1. The ω-2θ scan of the (110) plane. ω-2θ扫描得到的外延Fe膜(110)面的HRXRD图谱

Fig. 2. Azimuthal dependence of the normalized in-plane remanence for epitaxial Fe films with different dose implantation at room temperature.室温下不同剂量离子注入的外延Fe膜的归一化面内剩磁极图

Fig. 3. Normalized in-plane remanence curves for the epitaxial Fe films with different doses of ion implantation at room temperature.室温下不同剂量离子注入的外延Fe膜的归一化面内剩磁曲线

Fig. 4. Cross-sectional TEM images for the as-deposited and implanted samples with a series of different N⁺ dose: (a) The as-deposited samples; (b) the irradiated samples dose of 5 × 10¹⁵ ions/cm²; (c) the irradiated samples dose of 5 × 10¹⁶ ions/cm². 不同剂量离子注入样品的切面高分辨TEM　(a) 未注入样品; (b) 辐照剂量为5 × 10¹⁵ ions/cm²; (c) 辐照剂量为5 × 10¹⁶ ions/cm²

Fig. 5. Azimuthal dependence of the normalized in-plane remanence for the as-deposited and ion beam etched samples at room temperature.室温下未注入Fe膜和刻蚀后的Fe膜的归一化面内剩磁极图

Fig. 6. Normalized in-plane remanence curves for the as-deposited and ion beam etched samples at room temperature.室温下未注入Fe膜和刻蚀后的Fe膜的归一化剩磁曲线