• Optoelectronics Letters
  • Vol. 15, Issue 1, 64 (2019)
Lei CHEN1, Li-qiang LI2, and Quan-sen SUN1、*
Author Affiliations
  • 1School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Shangqiu Normal University, Shangqiu 476000, China
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    DOI: 10.1007/s11801-019-8080-y Cite this Article
    CHEN Lei, LI Li-qiang, SUN Quan-sen. A family of measurement basis for fast com-pressed imaging[J]. Optoelectronics Letters, 2019, 15(1): 64 Copy Citation Text show less
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    CHEN Lei, LI Li-qiang, SUN Quan-sen. A family of measurement basis for fast com-pressed imaging[J]. Optoelectronics Letters, 2019, 15(1): 64
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