• Chinese Journal of Lasers
  • Vol. 31, Issue 12, 1473 (2004)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on the Effects of Directional Ion Cleaning on the Characteristics of Substrate Surface[J]. Chinese Journal of Lasers, 2004, 31(12): 1473 Copy Citation Text show less
    References

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    [7] Harold R. Kaufman, Raymond S. Robinson, Richard Ian Seddon. End-Hall ion source [J]. J. Vac. Sci. Technol. A, 1987, 5(4):2081~2084

    [9] Luke Hanley, Susan B. Sinnott. The growth and modification of materials via ion Csurface processing [J]. Surface Science, 2002, 500:500~522

    [11] G. Rasigni, F. Varnier, J. P. Palmari et al.. Study of surface roughness for thin films of CaF2 deposition on glass substrates [J]. Opt. Commun., 1983, 46(5-6):294~299

    [13] S. Mohan, M. Ghanashyam Krishna. A review of ion beam assisted deposition of optical thin films [J]. Vacuum, 1995, 46(7):645~659

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on the Effects of Directional Ion Cleaning on the Characteristics of Substrate Surface[J]. Chinese Journal of Lasers, 2004, 31(12): 1473
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