• Journal of Applied Optics
  • Vol. 43, Issue 6, 1130 (2022)
Jie LU1, Le CHANG2,*, Yixin CHEN3, Yunlong JIANG2..., Tianning SU2, Beihong LIU2, Hang ZHAO2, Yunsheng QIAN1 and Jian LIU1|Show fewer author(s)
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2North Night Vision Technology Co.,Ltd., Kunming 650217, China
  • 3Nanjing Magewell Electronics Co.,Ltd., Nanjing 210094, China
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    DOI: 10.5768/JAO202243.0604012 Cite this Article
    Jie LU, Le CHANG, Yixin CHEN, Yunlong JIANG, Tianning SU, Beihong LIU, Hang ZHAO, Yunsheng QIAN, Jian LIU. Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1130 Copy Citation Text show less
    Structure block diagram of rapid afterglow time test system for fluorescent screen
    Fig. 1. Structure block diagram of rapid afterglow time test system for fluorescent screen
    Physical drawing of rapid afterglow time test system for fluorescent screen
    Fig. 2. Physical drawing of rapid afterglow time test system for fluorescent screen
    Physical drawing of rapid afterglow time inner structure of camera obscura
    Fig. 3. Physical drawing of rapid afterglow time inner structure of camera obscura
    Structure block diagram of luminance test module
    Fig. 4. Structure block diagram of luminance test module
    Hardware physical drawing of luminance test module
    Fig. 5. Hardware physical drawing of luminance test module
    Program interface of rapid afterglow time test system for fluorescent screen
    Fig. 6. Program interface of rapid afterglow time test system for fluorescent screen
    Iteration diagram of Kalman filtering algorithm
    Fig. 7. Iteration diagram of Kalman filtering algorithm
    Schematic diagram of Kalman filter with different parameter values
    Fig. 8. Schematic diagram of Kalman filter with different parameter values
    Flow chart of fast finding jump edge algorithm based on downsampling
    Fig. 9. Flow chart of fast finding jump edge algorithm based on downsampling
    Afterglow curve of light source under empty-tube conditions
    Fig. 10. Afterglow curve of light source under empty-tube conditions
    Schematic diagram of afterglow curve of fluorescent screen
    Fig. 11. Schematic diagram of afterglow curve of fluorescent screen
    Schematic diagram of luminance curves of fluorescent screen under different gain voltages
    Fig. 12. Schematic diagram of luminance curves of fluorescent screen under different gain voltages
    Schematic diagram of luminance curves of fluorescent screen under different light source intensities
    Fig. 13. Schematic diagram of luminance curves of fluorescent screen under different light source intensities
    脉冲方波参数脉冲方波指标
    周期/µs10
    振幅/V1.70~1.80
    频率/kHz100
    占空比/%50~90
    上升时间/ns2
    下降时间/ns2
    Table 1. Signal parameter setting of high-speed signal generator
    次数余辉时间/ns次数余辉时间/ns
    112.64611.53
    211.82711.48
    312.46812.20
    410.85910.98
    511.061011.54
    平均值/ns11.656
    Table 2. Test results of light source afterglow under empty-tube conditions
    次数余辉时间/ns次数余辉时间/ns
    1118.49336116.2533
    2118.21337117.4400
    3113.36008117.5839
    4122.08009119.9867
    5120.733310116.8000
    平均值/ns118. 0944
    重复度/%2.08
    Table 3. Afterglow test results in single mode
    Jie LU, Le CHANG, Yixin CHEN, Yunlong JIANG, Tianning SU, Beihong LIU, Hang ZHAO, Yunsheng QIAN, Jian LIU. Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1130
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