• Infrared Technology
  • Vol. 45, Issue 12, 1299 (2023)
Shijin WANG1, Wanxiang ZHENG2, Jinghui CHENG2, Xiaoxuan WANG2..., Tingyu YAN1, Changshan YAN2 and Qiaofang WANG2|Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    WANG Shijin, ZHENG Wanxiang, CHENG Jinghui, WANG Xiaoxuan, YAN Tingyu, YAN Changshan, WANG Qiaofang. Reliability Estimation of Thermal Imagers Based on Prior Information[J]. Infrared Technology, 2023, 45(12): 1299 Copy Citation Text show less
    References

    [9] Xavier Breniere, Philippe Tribolet. IR detectors life cycle cost andreliability optimization for tactical application[C]//Proc. of SPIE, 2006:6395: 63950D.

    [10] Xavier Breniere, Laurent Rubaldo, Frederic Dupont. Sofradir’s recentimprovement regarding the reliability and performance of HgCdTe IRdetectors[C/OL][2014-06-24]//Defense, Security Symposium, https://www.semanticscholar.org/paper/Sofradir's-recent-improvements-regarding-the-and-of-Breni%C3%A8re-Rubaldo/b2eba22cb82bd059b9f4d8f61e4fe7449b153224 (DOI:10.1117/ 12.2051705).

    [11] Salazar W E. Report on the statue of linear drive coolers for thedepartment of defense standard advanced dewar assembly[C]//Proc. ofSPIE, 2003, 4820: (DOI: 10.1117/12.451177).

    [13] Xavier Breniere, Alain Manissadjian, Michel Vuillermet. Reliabilityoptimization for IR detectors with compact cryo-coolers[C]//Proc. ofSPIE, 2005, 5783: (DOI: 10.1117/12.607591).

    WANG Shijin, ZHENG Wanxiang, CHENG Jinghui, WANG Xiaoxuan, YAN Tingyu, YAN Changshan, WANG Qiaofang. Reliability Estimation of Thermal Imagers Based on Prior Information[J]. Infrared Technology, 2023, 45(12): 1299
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