[1] CHENG SH CH.Optical Instrument Calibration[M].beijing:Weapon Industry Press,1992.(in Chinese)
[2] YANG M Y,KWON Oh-dal.Crater wear measurement using computer vision and automatic focusing[J]. Journal of Materials Processing Technology ,1996,58(4):362-367.
[3] LI H M.The auto-focus on measuring instruments[J].Beijing Surveying and Mapping,1998,3:36-38.(in Chinese)
[6] ZHANG W,WANG YF,DONG W.Research on automatic parallax measurement[J].Optical Technology,2002,28(4):365-366.(in Chinese)
[7] LI G,ZHOU B,DONG W,et al.. Measuring parallax of the telescope system with CCD device[J].Optical Instruments,2002,24(2):3-6. (in Chinese)
[9] MA X H, TAN Q L, ZHANG W D. Improvement to CCD capturing method for higher resolving images[J]. ISTM,2005,6(7):6430-6432.
[10] ELAD M,FEUER A. Restoration of a single superresolution image from several blurred, noise, and undersampled measured Images[J]. IEEE Transactions on Image Processing,1997,6(12):1646-1658.
[11] WEI L, HEE K S. Improved optimization strategies for autofocusing motion compensation in MRI via the analysis of image metric maps[J]..Magnetic Resonance Imaging,2006,24(6):751-760.
[12] FAN K CH,CHU C L,MOU J I, Development of a low-cost autofocusing probe for profile measurement[J]. Meas. Sci. Technol,2001,12(12):2137-2146