• High Power Laser and Particle Beams
  • Vol. 31, Issue 9, 93201 (2019)
Liu Jian, Chen Dihu, and Su Tao
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.11884/hplpb201931.190161 Cite this Article
    Liu Jian, Chen Dihu, Su Tao. Failure mechanism of a kind of FPGA chip under RF interference[J]. High Power Laser and Particle Beams, 2019, 31(9): 93201 Copy Citation Text show less
    References

    [1] Christopoulos C. Electromagnetic compatibility (EMC) in challenging environments[M]. Springer International Publishing, 2017.

    [3] Coulson D R. EMC-hardening microprocessor-based systems[C]//IEE Colloquium on Achieving Electromagnetic Compatibility: Accident or Design. 1997.

    [4] Fiori F, Musolino F. Analysis of EME produced by a microcontroller operation[C]//Proceedings Design, Automation and Test in Europe Conference and Exhibition. 2001.

    [5] Su T, Unger M, Steinecke T, et al. Using Error-Source Switching (ESS) concept to analyze the conducted radio frequency electromagnetic immunity of microcontrollers[J]. IEEE Transactions on Electromagnetic Compatibility, 2012, 54(3):634-645.

    [6] Dehbaoui A, Dutertre J M, Robisson B, et al. Electromagnetic transient faults injection on a hardware and a software implementations of AES[C]//Fault Diagnosis and Tolerance in Cryptography (FDTC). 2012.

    [7] Zussa L, Dehbaoui A, Tobich K, et al. Efficiency of a glitch detector against electromagnetic fault injection[C]//Conference on European Design and Automation Association. 2014.

    [8] Ren L, Li T, Chandra S.Prediction of power supply noise from switching activity in an FPGA[J]. IEEE Transactions on Electromagnetic Compatibility, 2014, 56(3):699-706.

    [10] Xilinx Inc.Series FPGAs Configuration User Guide.Version[EB/OL]. http://china.xilinx.com/support/documentation/user_guides/ug470_7Series_Config.pdf.

    Liu Jian, Chen Dihu, Su Tao. Failure mechanism of a kind of FPGA chip under RF interference[J]. High Power Laser and Particle Beams, 2019, 31(9): 93201
    Download Citation