[1] A. Goetzberger, C. Hebling, and H. W. Schock, Mater. Sci. Eng. R-Rep. 40, 1 (2003).
[2] P. E. Glaser, Science 162, 857 (1968).
[3] C. Strumpel, M. McCann, G. Beaucarne, V. Arkhipov, A. Slaoui, V. Svrcek, C. del Canizo, and I. Tobias, Sol. Energ. Mat. Sol. C 91, 238 (2007).
[4] C. Yang, D. Wan, Z. Wang, and F. Huang, Chin. Opt. Lett. 9, 103102 (2011)
[5] T. Trupke, M. A. Green, and P. Wurfel, J. Appl. Phys. 92, 4117 (2002).
[6] T. Trupke, M. A. Green, and P. Wurfel, J. Appl. Phys. 92, 1668 (2002).
[7] E. Mutlugun, I. M. Soganci, and H. V. Demir, Opt. Express 16, 3537 (2008).
[8] W. van Sark, A. Meijerink, and R. Schropp, J. van Roosmalen, and E. H. Lysen, Semiconductors 38, 962 (2004).
[9] V. Svrcek, A. Slaoui, and J. C. Muller, Thin Solid Films 451, 384 (2004).
[10] A. Le Donne, M. Acciarri, D. Narducci, S. Marchionna, and S. Binetti, Prog. Photovolt: Res. Appl. 17, 519 (2009).
[11] S. Marchionna, F. Meinardi, M. Acciarri, S. Binetti, A. Papagni, S. Pizzini, V. Malatesta, and R. Tubino, J. Lumin. 118, 325 (2006).
[12] M. Stupca, M. Alsalhi, T. Al Saud, A. Almuhanna, and M. H. Nayfeh, Appl. Phys. Lett. 91, 063107 (2007).
[13] Y. Fang, Z. Xie, L. Qi, W. Li, Z. Zhang, and M. Lu, Nanotechnology 16, 769 (2005).
[14] Z. Xie, J. Zhu, M. Zhang, Y. Zhao, and M. Lu, Appl. Surf. Sci. 255, 3833 (2009).
[15] Film WizardTM Software Scientific Computing International.
[16] W. Li and X. Fan, Rare Metal Materials and Engineering 37, 80 (2008).
