Contents
2024
Volume: 1 Issue 1
2 Article(s)

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Research Article
Video-level and high-fidelity super-resolution SIM reconstruction enabled by deep learning
Hanchu Ye, Zitong Ye, Yunbo Chen, Jinfeng Zhang, Xu Liu, Cuifang Kuang, Youhua Chen, and Wenjie Liu
Structure illumination microscopy (SIM) imposes no special requirements on the fluorescent dyes used for sample labeling, yielding resolution exceeding twice the optical diffraction limit with low phototoxicity, which is therefore very favorable for dynamic observation of live samples. However, the traditional SIM algo
Advanced Imaging
  • Publication Date: Apr. 05, 2024
  • Vol. 1, Issue 1, 011001 (2024)