• Acta Photonica Sinica
  • Vol. 42, Issue 2, 132 (2013)
XU Guang-hui1、2、*, CHAI Guang-yue1, HUANG Chang-tong1, HE Li-ming1, XU Jian1, LIAO Shi-dong1, and FENG Dan-hua1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/gzxb20134202.0132 Cite this Article
    XU Guang-hui, CHAI Guang-yue, HUANG Chang-tong, HE Li-ming, XU Jian, LIAO Shi-dong, FENG Dan-hua. High Frequency Electrical Parameter Extraction for Photodetectors Based on Coplanar Waveguide Microstrips[J]. Acta Photonica Sinica, 2013, 42(2): 132 Copy Citation Text show less

    Abstract

    For no on-wafer measurement of photodetectors (PDs), a simple and effective method to determine high frequency electrical parameters of the equivalent circuit model is presented. Firstly, a coplanar waveguide (CPW) microstrip matched with the microwave probe is designed, and the measured output reflection coefficient shows good agreement with the theoretical design. The chip is mounted on the CPW microstrip and the output reflection coefficient of the PD test-fixture is measured. The equivalent circuit model including the PD, the bondwire and the CPW elements is simulated. By fitting the measured output reflection coefficient of the test-fixture, high frequency electrical parameters of the PD are extracted.
    XU Guang-hui, CHAI Guang-yue, HUANG Chang-tong, HE Li-ming, XU Jian, LIAO Shi-dong, FENG Dan-hua. High Frequency Electrical Parameter Extraction for Photodetectors Based on Coplanar Waveguide Microstrips[J]. Acta Photonica Sinica, 2013, 42(2): 132
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