• Optoelectronics Letters
  • Vol. 16, Issue 1, 75 (2020)
Hong-xin ZHANG*, Xu ZHANG, Hao-ran QIU, and Hao ZHOU
Author Affiliations
  • Key Laboratory of Advanced Manufacturing and Intelligent Technology, Ministry of Education, Harbin University of Science and Technology, Harbin 150080, China
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    DOI: 10.1007/s11801-020-9051-z Cite this Article
    ZHANG Hong-xin, ZHANG Xu, QIU Hao-ran, ZHOU Hao. Automatic wavefront reconstruction on single interferogram with spatial carrier frequency using Fourier transform[J]. Optoelectronics Letters, 2020, 16(1): 75 Copy Citation Text show less

    Abstract

    Optical interferometry can be applied to obtain the wavefront phase and reconstruct the three-dimensional wavefront by analyzing interference fringes. Single interferogram analysis based on two-dimensional Fourier transform is proposed. This method just needs to acquire and analyze single interferogram to solve the wavefront phase. Compared with phase-shift method, Single interferogram analysis can reduce experiment cost and the limitation of measuring environment like vibration, airflow and noise, and meet the requirement of real-time and dynamic interferometry. Because the wavefront phase information is included in the carrier frequency components of single interferogram, an image edge detection method is used to automatically extract the center and boundary of the first-order carrier component of the spatial spectrum of the interferogram in the frequency domain.
    ZHANG Hong-xin, ZHANG Xu, QIU Hao-ran, ZHOU Hao. Automatic wavefront reconstruction on single interferogram with spatial carrier frequency using Fourier transform[J]. Optoelectronics Letters, 2020, 16(1): 75
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