• Journal of Advanced Dielectrics
  • Vol. 13, Issue 6, 2345002 (2023)
Zhongwen Li*, Siyi Zhang, Qingsheng Li, and Hao Liu**
Author Affiliations
  • Faculty of Mathematics and Physics, Huaiyin Institute of Technology, Huai’an, Jiangsu 223003, P. R. China
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    DOI: 10.1142/S2010135X23450029 Cite this Article
    Zhongwen Li, Siyi Zhang, Qingsheng Li, Hao Liu. Analysis of multi-center topological domain states in BiFeO3 nanodot arrays[J]. Journal of Advanced Dielectrics, 2023, 13(6): 2345002 Copy Citation Text show less

    Abstract

    High-density ferroelectric BiFeO3 (BFO) nanodot arrays were developed through template-assisted tailoring of epitaxial thin films. By combining piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM) imaging techniques, we found that oxygen vacancies in nanodot arrays can be transported in the presence of an electric field. Besides triple-center domains, quadruple-center domains with different vertical polarizations were also identified. This was confirmed by combining the measurements of the domain switching and polarization vector distribution. The competition between the accumulation of mobile charges, such as oxygen vacancies, on the interface and the geometric constraints of nanodots led to the formation of these topological domain states. These abnormal multi-center topological defect states pave the way for improving the storage density of ferroelectric memory devices.
    Zhongwen Li, Siyi Zhang, Qingsheng Li, Hao Liu. Analysis of multi-center topological domain states in BiFeO3 nanodot arrays[J]. Journal of Advanced Dielectrics, 2023, 13(6): 2345002
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