To obtain both high sensitivity and high throughput when measuring at the same time, a static doublegain Hadamard spectrometer is introduced, based on microslit array. The principle and instrument structure of static doublegain Hadamard spectrometer are described, and spectra aliasing caused by Hadamard encoding mask is investigated. The relationship between spectral offset and the spatial offset of incident slit is obtained. For a given wavelength spectrum, the spatial offset caused by the spatial offset of incident slit is also calculated in theory. The simulation results show that this method has no complex computation, with fast correction, and is easy in program realization.