The surface plasmon resonance technique was used for imaging of the dielectric sample. Based on a large numerical aperture microscope objective configuration, a light beam from a HeNe laser (λ=632.8 nm) was converged to excite surface plasmon resonance on gold film. The image of Si3N4 grating on the gold film was acquired by using a slit which restricts the incident angle of imaging beam. CCD was placed to detect the reflected light and get the surface plasmon resonance image of the sample at the conjugate plane of the sample. The images of sample was obtained at incident angles from 44° to 54° via scaning of the slit. The surface plasmon resonance curves of each point of the sample was extracted from this set of images. Grayscale image of resonance angular spectra of sample was reconstructed by computer simultaneously using the resonance angles corresponding to each point of sample.