• Optoelectronics Letters
  • Vol. 17, Issue 5, 276 (2021)
Jun-wei LI1, Zu-jun WANG2、*, Cheng-ying SHI1, Yuan-yuan XUE2, Hao NING3, and Rui XU3
Author Affiliations
  • 1Xi’an Research Institute of High-Technology, Xi’an 710025, China
  • 2Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 3School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China
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    DOI: 10.1007/s11801-021-0107-5 Cite this Article
    LI Jun-wei, WANG Zu-jun, SHI Cheng-ying, XUE Yuan-yuan, NING Hao, XU Rui. Evaluating electron induced degradation of triple-junction solar cell by numerical simulation[J]. Optoelectronics Letters, 2021, 17(5): 276 Copy Citation Text show less

    Abstract

    In this paper, the degradation related parameters of GaInP/GaAs/Ge triple-junction solar cell induced by electron irradiation are carried out by numerical simulation. The degradation results of short-circuit current, open-circuit voltage, maximum power have been investigated, and the degradation mechanism is analyzed. Combining the degradation results, the degradation of normalized parameters versus displacement damage dose is obtained. The results show that the degradation increases with the increase of the electron fluence and electron irradiation energy. The degradation normalized related parameters versus displacement damage dose can be characterized by a special curve that is not affected by the type of irradiated particles. By calculating the annual displacement damage dose and the on-orbit operation time of special space orbit, the degradation of normalized parameters can be obtained with the fitting curve in the simulation. The study will provide an approach to estimate the radiation damage of triple-junction solar cell induced by space particle irradiation.
    LI Jun-wei, WANG Zu-jun, SHI Cheng-ying, XUE Yuan-yuan, NING Hao, XU Rui. Evaluating electron induced degradation of triple-junction solar cell by numerical simulation[J]. Optoelectronics Letters, 2021, 17(5): 276
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