• Optoelectronics Letters
  • Vol. 17, Issue 11, 641 (2021)
Rui ZHANG*, Wenyi REN, He WANG, Yuanyuan WANG, Zhenkun LIN, and Ziqi HAN
Author Affiliations
  • School of Science, Northwest Agriculture and Forestry University, Yangling 712100, China
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    DOI: 10.1007/s11801-021-1065-7 Cite this Article
    ZHANG Rui, REN Wenyi, WANG He, WANG Yuanyuan, LIN Zhenkun, HAN Ziqi. Raman spectroscopic detection using a two-dimensional echelle spectrometer[J]. Optoelectronics Letters, 2021, 17(11): 641 Copy Citation Text show less

    Abstract

    In order to meet the high-resolution and wide spectrum range of the backscattering Raman system, this paper designs and builds a Raman test system based on the echelle spectrometer. In the optical splitting system, compared with the ordinary planar grating spectrometer, the use of the echelle improves the resolution of the system without increasing the volume of the system. The use of intensified charge-coupled device (ICCD) in the detection system improves the signal-to-noise ratio (SNR) and the detection limit of weak spectrum. Finally, the Raman system was spectrally calibrated. The broadband backscattering Raman experimental results are given and discussed. The experimental results show that the system has an excellent application prospect for broadband and high-resolution Raman spectrum measurement.
    ZHANG Rui, REN Wenyi, WANG He, WANG Yuanyuan, LIN Zhenkun, HAN Ziqi. Raman spectroscopic detection using a two-dimensional echelle spectrometer[J]. Optoelectronics Letters, 2021, 17(11): 641
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