• Acta Photonica Sinica
  • Vol. 48, Issue 5, 516001 (2019)
XIE Lei*, LEI Xiao-hua, TAN Xiao-gang, LIU Xian-ming, DENG Yi-jun, and CHEN Wei-min
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb20194805.0516001 Cite this Article
    XIE Lei, LEI Xiao-hua, TAN Xiao-gang, LIU Xian-ming, DENG Yi-jun, CHEN Wei-min. Effect of Laser Power Density on Reduction of Graphene Oxide under the Same Exposure[J]. Acta Photonica Sinica, 2019, 48(5): 516001 Copy Citation Text show less

    Abstract

    Light reduction experiments were carried out with a 488 nm continuous laser under the same exposure. Simultaneously the properties of reduced graphene oxide (rGO) were characterized by transmittance and resistivity. The results show that during the reduction process, the degree of reduction characterized by resistivity and transmittance presents the same trend. Moreover, the reduction process is divided into two steps: before reaching the relatively stable state and reaching the relatively stable state. Before reaching the relatively stable state, the lower the laser power density, the higher the reduction degree of the samples; but when reaching the relatively stable state, the higher laser power density, the higher the reduction degree of the samples. This phenomenon is further analyzed by means of photon penetration and bandgap modulation, based on the change of oxygenated functional groups in rGO.
    XIE Lei, LEI Xiao-hua, TAN Xiao-gang, LIU Xian-ming, DENG Yi-jun, CHEN Wei-min. Effect of Laser Power Density on Reduction of Graphene Oxide under the Same Exposure[J]. Acta Photonica Sinica, 2019, 48(5): 516001
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