• Acta Photonica Sinica
  • Vol. 43, Issue 8, 823003 (2014)
HAN Yu*, GUO Wei-ling, FAN Xing, YU Xin, and BAI Jun-xue
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb20144308.0823003 Cite this Article
    HAN Yu, GUO Wei-ling, FAN Xing, YU Xin, BAI Jun-xue. Effects of Electrostatic-Discharge on GaN-Based High Voltage Light-Emitting Diode[J]. Acta Photonica Sinica, 2014, 43(8): 823003 Copy Citation Text show less

    Abstract

    GaN-based high-voltage green light-emitting diodes were biased by negative Human-Body-Mode electrostatic discharge (ESD) with -500,-1 000,-2 000,-3 000,-4 000,-5 000 and -6 000 V.The I-V characteristic and luminous flux under different electrostatic shock voltages were comparative analyzed after each shock.The results show that the LED has a soft breakdown which accompanied with apparent increased reverse leakage current and unapparent luminous flux change ,which due to the generation of defect after ESD stressing at -500,-1 000,-2 000,-3 000 and -4 000V;When the device was biased to -5 000 V and -6 000 V,a sharp decrease of luminous flux appears,even decay to 50% of light output than before stressing.And forward voltage and reverse leakage current show a large degree of decrease and increase respectively after ESD shock of -6000V,which is due to the thermal model breakdown at this moment.The thermal model breakdown make temperature rise rapidly and form a melting channel,which disabled the LED eventually.
    HAN Yu, GUO Wei-ling, FAN Xing, YU Xin, BAI Jun-xue. Effects of Electrostatic-Discharge on GaN-Based High Voltage Light-Emitting Diode[J]. Acta Photonica Sinica, 2014, 43(8): 823003
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