• Chinese Optics Letters
  • Vol. 6, Issue 9, 661 (2008)
Xinghua Zhang1、2、*, Baosheng Zhao1, Zhenhua Miao1、2, Wei Li1、2, Xiangping Zhu1, Yong’an Liu1、2, and Wei Zou1
Author Affiliations
  • 1State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049
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    DOI: 10.3788/COL20080609.0661 Cite this Article Set citation alerts
    Xinghua Zhang, Baosheng Zhao, Zhenhua Miao, Wei Li, Xiangping Zhu, Yong’an Liu, Wei Zou. Correction of ultraviolet single photon counting image distortion[J]. Chinese Optics Letters, 2008, 6(9): 661 Copy Citation Text show less

    Abstract

    Single photon counting imaging technology has been widely used in space environment detection, astronomy observation, nuclear physics, and ultraweak bioluminescence. However, the distortion of the single photon counting image will badly affect the measurement results. Therefore, the correction of distortion for single photon counting image is very significant. Ultraviolet single photon imaging system with wedge and strip anode is introduced and the influence factor leading to image distortion is analyzed. To correct original distorted image, three different image correction methods, namely, the physical correction, the global correction, and the local correction, are applied. In addition, two parameters, i.e., the position index and the linearity index, are defined to evaluate the performance of the three methods. The results suggest that the correction methods can improve the quality of the initial image without losing gray information of each counting light spot. And the local correction can provide the best visual inspections and performance evaluation among the three methods.
    Xinghua Zhang, Baosheng Zhao, Zhenhua Miao, Wei Li, Xiangping Zhu, Yong’an Liu, Wei Zou. Correction of ultraviolet single photon counting image distortion[J]. Chinese Optics Letters, 2008, 6(9): 661
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