• Chinese Optics Letters
  • Vol. 11, Issue 10, 102302 (2013)
Fanyu Kong, Yunxia Jin, Shijie Liu, Shunli Chen, Heyuan Guan, Kai He, Ying Du, and Hongbo He
DOI: 10.3788/col201311.102302 Cite this Article Set citation alerts
Fanyu Kong, Yunxia Jin, Shijie Liu, Shunli Chen, Heyuan Guan, Kai He, Ying Du, Hongbo He. Femtosecond laser damage of broadband pulse compression gratings[J]. Chinese Optics Letters, 2013, 11(10): 102302 Copy Citation Text show less

Abstract

The fabricated gratings used for an 800-nm compressed laser pulse have more than 90% diffraction efficiency in the –1st order for TE polarization within 760–860 nm, and the maximum value is 94.3%. The laserinduced damage threshold (LIDT) of the gratings increases from 0.53 to 0.75 J/cm2 in the normal beam in a pulse width \tau of 40–100 fs. The LIDT of the gratings is observed a \tau^{0.25} scaling in the pulse width region. The damage morphologies of the gratings indicate that the initial damage of the gratings locates at the grating lines, a position that coincides with that of the electric field maximum.
Fanyu Kong, Yunxia Jin, Shijie Liu, Shunli Chen, Heyuan Guan, Kai He, Ying Du, Hongbo He. Femtosecond laser damage of broadband pulse compression gratings[J]. Chinese Optics Letters, 2013, 11(10): 102302
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