• Journal of Advanced Dielectrics
  • Vol. 13, Issue 5, 2350016 (2023)
Li-na Liu1, Xiao-ming Chen1、*, Xing-xing Wang1, and Han-li Lian2、**
Author Affiliations
  • 1School of Physics and Information Technology, Shaanxi Normal University, Xi’an 710119, P. R. China
  • 2School of Science, Xi’an University of Posts and Telecommunications, Xi’an 710121, P. R. China
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    DOI: 10.1142/S2010135X23500169 Cite this Article
    Li-na Liu, Xiao-ming Chen, Xing-xing Wang, Han-li Lian. Achieving excellent temperature-stable dielectric properties of Bi0.5Na0.5TiO3-based lead-free ceramics via doping AgNbO3[J]. Journal of Advanced Dielectrics, 2023, 13(5): 2350016 Copy Citation Text show less

    Abstract

    The lead-free ceramics (1?x)(0.94Bi0.47Na0.47Ba0.06TiO3-0.06BiAlO3)-xAgNbO3 (denoted as BNBTA-xAN) were synthesized via a solid-state sintering method. The effect of AgNbO3 doping amount on dielectric properties of the ceramics was studied systematically. X-ray diffraction (XRD), scanning electron microscope (SEM) and Raman spectroscope were used to detect the structure of the ceramics. Temperature-dependent dielectric spectra, frequency-dependent dielectric constant and alternating current (ac) electric conductance at various temperatures were measured. The doping of AgNbO3 greatly reduces dielectric constant around Curie temperature and thus enhances the temperature stability of the dielectric constant. The ceramic BNBTA-0.03AN exhibits excellent temperature-stable dielectric properties with temperature coefficient of capacitance (TCC) ±15% between 55°C and 418°C with temperature window 363°C and small changes of dielectric constant and dielectric loss from 100 Hz to 1 MHz at different temperatures. The obtained ceramics are expected to be used in high-temperature capacitors due to its excellent temperature stability.
    Li-na Liu, Xiao-ming Chen, Xing-xing Wang, Han-li Lian. Achieving excellent temperature-stable dielectric properties of Bi0.5Na0.5TiO3-based lead-free ceramics via doping AgNbO3[J]. Journal of Advanced Dielectrics, 2023, 13(5): 2350016
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