• Chinese Optics Letters
  • Vol. 7, Issue 8, 08728 (2009)
Leihong Zhang1、2, Yan Yang1, Wenbing Xia1, Xiaolei Zhu1, Weibiao Chen1, and Yutian Lu1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2College of Mechanical Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
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    DOI: 10.3788/COL20090708.0728 Cite this Article Set citation alerts
    Leihong Zhang, Yan Yang, Wenbing Xia, Xiaolei Zhu, Weibiao Chen, Yutian Lu. Linearity of quadrant avalanche photodiode in laser tracking system[J]. Chinese Optics Letters, 2009, 7(8): 08728 Copy Citation Text show less

    Abstract

    The tracking precision of laser tracking system is affected by the angular resolution of quadrant avalanche photodiode. According to the detecting principle of quadrant avalanche photodiode, the light spot area, the optical intensity distribution, the non-uniformity of response, and the signal-to-noise ratio (SNR) that affect the linearity of the detector are studied. The light optical spot area and the optical intensity distribution can be adjusted through software. The non-uniformity of response and the SNR are influenced by the noise of the detector. Because the noise is affected by the optical intensity of the incident laser, it is difficult to obtain the law of the linearity caused by noise. When the light spot area and the optical intensity distribution are fixed, the other factors can be measured. With the detector scanned in raster scanning mode, the non-uniformity of response is measured at different SNRs. The linearity of detector is measured by a moving target that can reflect the illuminating laser to the detector in diffuse reflection mode. The nonlinear error of the linearity of detector can be minimized by increasing the SNR.
    Leihong Zhang, Yan Yang, Wenbing Xia, Xiaolei Zhu, Weibiao Chen, Yutian Lu. Linearity of quadrant avalanche photodiode in laser tracking system[J]. Chinese Optics Letters, 2009, 7(8): 08728
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